Onto Innovation engages in the design, development, manufacture and support of process control tools that perform macro-defect inspections and 2D/3D optical metrology, lithography systems, and process control analytical software used by bare silicon wafer manufacturers, semiconductor wafer fabricators, and packaging manufacturers. Co.'s products are also used for process control in a number of other markets, including manufacturing of light emitting diodes, vertical-cavity surface-emitting lasers, micro-electromechanical systems, CMOS image sensors, compound semiconductor (SiC and GaN) power devices, RF filters and modules, data storage, and certain industrial and scientific applications.